Surge Endurance between Foil Conductors across a Narrow Gap on Printed Wiring Board

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  • プリント配線板ファインパターン導体間の耐サージ特性
  • プリント ハイセンバン ファインパターン ドウタイ カン ノ タイサージ トクセイ

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Abstract

The flashover voltages (FOVs) between foil conductors across a narrow gap on a printed wiring board with or without backing electrode were measured by four institutions using the same testing boards. The experiments were carried out in air at a room temperature and 40-55%RH. FOVs with two different configurations of the foil conductors on the board were measured. The gap distances studied ranged from 20μm to 200μm, and the thickness of the foil conductor on the board was 6μm or 18μm. The board thicknesses studied were from 60μm to 800μm. FOV was measured under the impulse voltage application (1.2/50μs). The dependences of FOV upon gap distance, polarity of applied voltage, the board thickness and foil thickness were clarified and discussed mainly comparing with calculated results of electric field. The following results are obtained commonly by the four institutions: When the gap distance is smaller than 50μm, FOV is almost independent of the existence of the backing electrode and the board thickness; FOV is independent of the thickness of the foil conductors; When the board thickness is 60μm, FOV is almost unchanged with the increase in the gap distance; FOV at positive voltage application is higher than that at the negative application.

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