X-Ray Phase Imaging with Single Phase Grating
X-ray phase imaging with a single phase grating based on the fractional Talbot effect is described. A phase grating with an 8 μm pitch was placed behind a weakly absorbing object and illuminated with partially coherent 17.7 keV X-rays. Intensity patterns downstream of the grating were recorded with a high-resolution image detector. By the fringe scanning method, an X-ray wavefront inclination by the object was obtained. Phase tomography was performed and the three-dimensional structure of a piece of a polymer blend was revealed with an 8 μm spatial resolution and a 9 mg/cm3 detection limit of density deviation.
- Japanese journal of applied physics. Pt. 2, Letters
Japanese journal of applied physics. Pt. 2, Letters 46(3), L89-L91, 2007-01-25
Japan Society of Applied Physics