X-Ray Phase Imaging with Single Phase Grating

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著者

    • Yashiro Wataru Yashiro Wataru
    • Department of Advanced Materials Science, Graduate School of Frontier Sciences, The University of Tokyo, 5-1-5 Kashiwanoha, Kashiwa, Chiba 277-8561, Japan
    • Aoki Sadao
    • Graduate School of Pure and Applied Sciences, University of Tsukuba, 1-1-1 Tennohdai, Tsukuba, Ibaraki 305-8573, Japan
    • Hattori Tadashi
    • Laboratory of Advanced Science and Technology for Industry, University of Hyogo, 3-1-2 Kouto, Kamigori, Hyogo 678-1205, Japan
    • Momose Atsushi
    • Department of Advanced Materials Science, Graduate School of Frontier Sciences, The University of Tokyo, 5-1-5 Kashiwanoha, Kashiwa, Chiba 277-8561, Japan

抄録

X-ray phase imaging with a single phase grating based on the fractional Talbot effect is described. A phase grating with an 8 μm pitch was placed behind a weakly absorbing object and illuminated with partially coherent 17.7 keV X-rays. Intensity patterns downstream of the grating were recorded with a high-resolution image detector. By the fringe scanning method, an X-ray wavefront inclination by the object was obtained. Phase tomography was performed and the three-dimensional structure of a piece of a polymer blend was revealed with an 8 μm spatial resolution and a 9 mg/cm3 detection limit of density deviation.

収録刊行物

  • Japanese journal of applied physics. Pt. 2, Letters

    Japanese journal of applied physics. Pt. 2, Letters 46(3), L89-L91, 2007-01-25

    Japan Society of Applied Physics

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各種コード

  • NII論文ID(NAID)
    10018495717
  • NII書誌ID(NCID)
    AA10650595
  • 本文言語コード
    EN
  • 資料種別
    SHO
  • ISSN
    0021-4922
  • NDL 記事登録ID
    8621582
  • NDL 雑誌分類
    ZM35(科学技術--物理学)
  • NDL 請求記号
    Z54-J337
  • データ提供元
    CJP書誌  NDL  JSAP 
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