SAXS and XAFS Characterization of Precipitates in a High-Performance Cu–Ni–Si Alloy

• Takahashi Yohei

  NISSAN ARC, LTD.

• Sanada Takashi

  NISSAN ARC, LTD.

• Sato Shigeo

  NISSAN ARC, LTD.

• Okajima Toshihiro

  Kyushu Synchrotron Light Research Center

• Shinoda Kozo

  Institute of Multidisciplinary Research for Advanced Materials, Tohoku University

• Suzuki Shigeru

  Institute of Multidisciplinary Research for Advanced Materials, Tohoku University

書誌事項

タイトル別名

• SAXS and XAFS Characterization of Precipitates in a High-Performance Cu–Ni–Si Alloy

抄録

Analyses of small-angle X-ray scattering (SAXS) and X-ray absorption fine structure (XAFS) were performed for characterizing precipitates formed in a Cu-3.1 at %Ni-1.4 at%Si alloy, the strength and electrical conductivity of which were improved by aging. SAXS profiles and XAFS spectra of samples aged at 720 K for different periods of time after a solution treatment were measured. SAXS profiles of samples, which were aged after the solution treatment and subsequently cold rolled, were also measured to investigate the effect of dislocations on precipitation. The results of SAXS measurements showed that nanometer-size precipitates formed in the alloy samples during isothermal aging at 720 K. The precipitates in the samples without cold rolling were coarsened in a single modal size distribution with increasing aging time. In contrast, the precipitates formed in the cold-rolled samples appeared to be coarsened in a multi-modal size distribution with increasing aging time. This aging characteristic of the cold-rolled samples is presumably attributable to their good electrical conductivity. The results of XAFS measurements at the Ni K-edge showed that nickel was substituted for copper in the face-centered cubic (fcc) copper matrix and that the local structure around nickel was changed by isothermal aging. With increasing aging time, extended X-ray absorption fine structure (EXAFS) functions at the Ni K-edge of the samples were found to be changed, which implies that nickel atoms were precipitated as nickel-silicon clusters or intermediate compounds in the fcc copper matrix. In addition, X-ray absorption near edge structure (XANES) spectra at the Ni K-edge indicated that the electronic structure of nickel in the samples was influenced by silicon during aging.

収録刊行物

• MATERIALS TRANSACTIONS

  MATERIALS TRANSACTIONS 48 (2), 101-104, 2007

  公益社団法人 日本金属学会

キーワード

• copper base alloy
• precipitation
• small angle X-ray scattering
• X-ray absorption fine structure

詳細情報

• CRID: 1390282679227670272
• NII論文ID: 10018508374
• NII書誌ID: AA1151294X
• DOI: 10.2320/matertrans.48.101
• ISSN: 13475320
• ISSN: 13459678
• HANDLE: 10097/52239
• NDL書誌ID: 8623492
• Web Site: https://tohoku.repo.nii.ac.jp/records/44167
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I8623492
• Web Site: https://www.jstage.jst.go.jp/article/matertrans/48/2/48_MBW200620/_pdf
• 本文言語コード: en
• データソース種別:
  • JaLC
  • IRDB
  • NDL
  • Crossref
  • CiNii Articles
• 抄録ライセンスフラグ: 使用不可