Near-Field Optical Recording/Readout Using a 405nm Wavelength GaN Laser Diode
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- SAITO Kimihiro
- Material Laboratories, Sony Corporation
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- SHINODA Masataka
- Material Laboratories, Sony Corporation
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- ISHIMOTO Tsutomu
- Material Laboratories, Sony Corporation
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- NAKAOKI Ariyoshi
- Material Laboratories, Sony Corporation
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- YAMAMOTO Masanobu
- Material Laboratories, Sony Corporation
Bibliographic Information
- Other Title
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- GaN系405nm半導体レーザーを用いた近接場光記録再生
- GaNケイ 405nm ハンドウタイ レーザー オ モチイタ キンセツバ ヒカリ キロク サイセイ
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Abstract
Near-field recording/readout using a solid immersion lens (SIL) is capable of achieving a numerical aperture (NA) of greater than unity and a higher storage density than conventional optical disc systems. In near-field recording using a SIL, a material having a higher refractive index results in a smaller spot size, as does using a shorter wavelength light source. However, the conventionally used GaN 405-nm laser diode (LD) still has several advantages over shorter wavelength light sources; for example, it can achieve a higher recording density and it is possible to produce more reliable near-field recording/readout systems based on it. We describe a trial that seeks to achieve a higher data transfer rate using a 1.84-NA dual-channel near-field recording/readout system that employs a monolithic dual-beam blue LD.
Journal
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- The Review of Laser Engineering
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The Review of Laser Engineering 35 (2), 86-90, 2007
The Laser Society of Japan
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Details 詳細情報について
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- CRID
- 1390282679625206400
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- NII Article ID
- 10018544504
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- NII Book ID
- AN00255326
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- ISSN
- 13496603
- 03870200
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- NDL BIB ID
- 8712109
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed