Scanning electrometer using the quantum Hall effect

• KAWANO Yukio

  RIKEN PRESTO, Japan Science and Technology Agency（JST）

Bibliographic Information

Other Title

• 量子ホール効果を用いた走査型エレクトロメーター
• 最近の展望 量子ホール効果を用いた走査型エレクトロメーター
• サイキン ノ テンボウ リョウシ ホール コウカ オ モチイタ ソウサガタ エレクトロメーター

Abstract

In this paper, the author presents scanning electrometer techniques, which give direct information on the spatial and temporal properties of electron transport. We have recently developed a new type of scanning electrometer employing the quantum Hall effect. The large Shubnikov de Haas oscillation in quantum Hall devices allows us to detect local voltage with high sensitivity and high speed. We have applied this technique to another quantum Hall sample, and have imaged the spatial distributions of voltage and noise voltage. The present results demonstrate that voltage mapping provides a strong tool for investigating charge dynamics.

Journal

• Oyo Buturi

  Oyo Buturi 76 (3), 269-274, 2007-03-10

  The Japan Society of Applied Physics

Keywords

• quantum Hall effect
• scanning electrometer
• capacitive coupling
• Shubnikov -de Haas oscillation
• charge fluctuation
• imaging of voltage and noise voltage
• edge state

Details

• CRID: 1390282752335620992
• NII Article ID: 10018560217
• NII Book ID: AN00026679
• DOI: 10.11470/oubutsu.76.3_269
• ISSN: 21882290
• ISSN: 03698009
• NDL BIB ID: 8731075
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I8731075
• Text Lang: ja
• Data Source:
  • JaLC
  • NDL
  • CiNii Articles
  • KAKEN
• Abstract License Flag: Disallowed