Characterization of Direct Immobilized Probe DNA on Partially Functionalized Diamond Solution-Gate Field-Effect Transistors
書誌事項
- タイトル別名
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- Characterization of Direct Immobilized Probe DNA on Partially Functionalized Diamond Solution Gate Field Effect Transistors
この論文をさがす
収録刊行物
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- Japanese journal of applied physics. Part 2, Letters & express letters
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Japanese journal of applied physics. Part 2, Letters & express letters 45 (42-45), L1114-1117, 2006-11
Tokyo : Japan Society of Applied Physics
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詳細情報
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- CRID
- 1522543655378488704
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- NII論文ID
- 10018632136
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- NII書誌ID
- AA11906093
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- ISSN
- 00214922
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- NDL書誌ID
- 8548069
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- 本文言語コード
- en
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- NDL 雑誌分類
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- ZM35(科学技術--物理学)
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- データソース種別
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- NDL
- CiNii Articles