走査型トンネル顕微鏡による低次元ナノ構造の創成と計測 Fabrication and Characterization of Low-Dimensional Nanostructures using Scanning Tunneling Microscopy

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著者

    • 藤田 大介 FUJITA Daisuke
    • 独立行政法人物質・材料研究機構ナノ計測センター Advance Nano Characterization Center, National Institute for Materials Science
    • 鷺坂 恵介 SAGISAKA Keisuke
    • 独立行政法人物質・材料研究機構ナノ計測センター Advance Nano Characterization Center, National Institute for Materials Science
    • 大西 桂子 [他] ONISHI Keiko
    • 独立行政法人物質・材料研究機構ナノ計測センター Advance Nano Characterization Center, National Institute for Materials Science

抄録

  Recent developments of fabrication, manipulation and characterization techniques at nanometer scale for low-dimensional nanostructures using scanning tunneling microscopy (STM) are reviewed. Firstly two reliable methods for metallic nanostructure formation using tip material transfer are introduced. Secondly STM-manipulation of Au nanoclusters grown on self-assembled monolayers is introduced, where single electron tunneling effect is clearly observable using tunneling spectroscopy. As a new type of STM manipulation, a reversible control method of surface periodic structures (phases) on Si(100) at low temperatures is introduced. Finally using a single atom deposition technique using a controlled point contact, fabrication of one-dimensional quantum well on a single dimer row of Si(100) surface is explained. Combining the fabrication and characterization capabilities of STM in various environments, STM can be a powerful tool for the exploration of nanotechnology and nanoscience.<br>

収録刊行物

  • 真空  

    真空 49(11), 653-658, 2006-11-20 

    The Vacuum Society of Japan

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各種コード

  • NII論文ID(NAID)
    10018632770
  • NII書誌ID(NCID)
    AN00119871
  • 本文言語コード
    JPN
  • 資料種別
    REV
  • ISSN
    05598516
  • NDL 記事登録ID
    8607186
  • NDL 雑誌分類
    ZN15(科学技術--機械工学・工業--流体機械)
  • NDL 請求記号
    Z16-474
  • データ提供元
    CJP書誌  NDL  J-STAGE 
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