バイオデバイスの飛行時間型二次イオン質量分析イメージング

• 青柳 里果

  島根大学生物資源科学部

書誌事項

タイトル別名

• Time-of-Flight Secondary Ion Mass Spectrometry Imaging of Biodevices
• バイオデバイス ノ ヒコウ ジカンガタ 2ジ イオン シツリョウ ブンセキ イメージング

抄録

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) imaging provides ten-nanometer-scale chemical images of biodevices. It is one of the most sensitive surface analysis methods and has recently been applied in life sciences. TOF-SIMS is useful for the evaluation of biodevice surfaces, because it provides ten-nanometer-scale mapping and chemical structures of immobilized proteins on devices. In addition, TOF-SIMS requires no pretreatment of samples, such as labeling with a fluorescent probe or coating with metallic thin films. In this paper, the principles of TOF-SIMS and data analysis methods are introduced, and some examples of biodevice observation with TOF-SIMS are described.

収録刊行物

• 質量分析

  質量分析 55 (1), 33-38, 2007

  一般社団法人 日本質量分析学会

キーワード

• TOF-SIMS
• Imaging
• Chemical mapping
• Biodevice
• Protein

詳細情報

• CRID: 1390282681471342336
• NII論文ID: 10018703006
• NII書誌ID: AN0010555X
• DOI: 10.5702/massspec.55.33
• ISSN: 18804225
• ISSN: 18843271
• ISSN: 13408097
• ISSN: http://id.crossref.org/issn/13408097
• NDL書誌ID: 8675272
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I8675272
• Web Site: http://www.jstage.jst.go.jp/article/massspec/55/1/55_1_33/_pdf
• 本文言語コード: ja
• データソース種別:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• 抄録ライセンスフラグ: 使用不可