Measurement of Delay Variation Due to Inductive Coupling Noise in 90nm Global Interconnects

• OGASAHARA Yasuhiro

  Dept. Information Systems Engineering, Osaka University

• HASHIMOTO Masanori

  Dept. Information Systems Engineering, Osaka University

• ONOYE Takao

  Dept. Information Systems Engineering, Osaka University

Bibliographic Information

Other Title

• 90nmグローバル配線における誘導性クロストークノイズによる遅延変動の実測

Journal

• 電子情報通信学会技術研究報告. ICD, 集積回路

  電子情報通信学会技術研究報告. ICD, 集積回路 106 (468), 13-18, 2007-01-11

Keywords

• signal integrity
• inductive crosstalk noise
• interconnect delay
• interconnect modeling

Details

• CRID: 1570572700432733952
• NII Article ID: 10018727566
• NII Book ID: AN10013276
• Text Lang: ja
• Data Source:
  • CiNii Articles