Development of Electrostatic Actuator, which enables the Stable Contact Resistance, Driven at Low Voltage
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- Masuda Takahiro
- Advanced Device Laboratry, Corporate R&D H. Q. Omron Corporation
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- Seki Tomonori
- Advanced Device Laboratry, Corporate R&D H. Q. Omron Corporation
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- Miyaji Takaaki
- Advanced Device Laboratry, Corporate R&D H. Q. Omron Corporation
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- Sato Fumihiko
- Advanced Device Laboratry, Corporate R&D H. Q. Omron Corporation
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The switches play an important role in making the multifunctional radio communication circuit and therefore, the high-performance microminiaturized high-frequency switches are urgently expected. RF-MEMS switch with mechanical switching structure is hoped to improve both high-frequency signal loss and isolation quality simultaneously and to provide better linearity on the performance and compatibility to silicon-based circuit elements. But considering the applications, such as cellular phone and wireless-LAN, lower driving voltage and smaller switch dimensions are required.<br>In order to solve these requirements, a novel electrostatic actuator with a unique structure of movable electrodes which enables the stable contact resistance is developed for RF-MEMS switches. This actuator has slits between the movable electrodes and the restoring spring. The electrostatic actuator with a movable electrode area of 0.5mm2 was driven at low voltage of 9-11V. And no defect due to restoration shortage is observed during switching test up to 400million cycles.<br>In this paper, the results of mechanical design of the electrostatic actuator, the simulation, the experiments, and the reliability test are described
収録刊行物
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- 電気学会論文誌E(センサ・マイクロマシン部門誌)
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電気学会論文誌E(センサ・マイクロマシン部門誌) 127 (3), 116-120, 2007
一般社団法人 電気学会
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詳細情報 詳細情報について
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- CRID
- 1390282679438377344
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- NII論文ID
- 10018737701
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- NII書誌ID
- AN1052634X
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- ISSN
- 13475525
- 13418939
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- NDL書誌ID
- 8728607
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
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