限流時におけるYBCO薄膜の破壊要因と限流性能向上に関する考察 Study on Reason of Destruction in YBCO Thin Film during Current Limiting and Improvement of the Performance in Current Limiting

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We have performed fault current limiting test using YBCO thin film and investigated reason of the destruction during current limiting. Destruction phenomena of the film are two patterns. One occurred immediately after current limiting and the other one occurred during current limiting. In a phenomena of destruction, quench propagation velocity almost doesn't change as against increases of energy consumption per unit time, energy consumption per unit area increases as energy consumption per unit time increases. Therefore, local part of the film reaches dissolution temperature and arc occurres.<br>As a result, it is considered that the performance of the film is improved by decreasing energy consumption per unit time. Thus, we connected parallel capacitor to the film for limiting energy consumption per unit time. Consequently, the performance of the film in current limiting will be improved.

収録刊行物

  • 電気学会論文誌. B, 電力・エネルギー部門誌 = The transactions of the Institute of Electrical Engineers of Japan. B, A publication of Power and Energy Society  

    電気学会論文誌. B, 電力・エネルギー部門誌 = The transactions of the Institute of Electrical Engineers of Japan. B, A publication of Power and Energy Society 127(3), 515-521, 2007-03-01 

    The Institute of Electrical Engineers of Japan

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各種コード

  • NII論文ID(NAID)
    10018738576
  • NII書誌ID(NCID)
    AN10136334
  • 本文言語コード
    JPN
  • 資料種別
    ART
  • ISSN
    03854213
  • NDL 記事登録ID
    8727476
  • NDL 雑誌分類
    ZN31(科学技術--電気工学・電気機械工業)
  • NDL 請求記号
    Z16-794
  • データ提供元
    CJP書誌  NDL  J-STAGE 
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