Local lattice parameter determination of a silicon (001) layer grown on a sapphire (1102) substrate using convergent-beam electron diffraction
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- AKAOGI Takayuki
- Asahi-Kasei Co. Ltd
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- TSUDA Kenji
- Institute of Multidisciplinary Research for Advanced Materials, Tohoku University
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- TERAUCHI Masami
- Institute of Multidisciplinary Research for Advanced Materials, Tohoku University
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- TANAKA Michiyoshi
- Institute of Multidisciplinary Research for Advanced Materials, Tohoku University
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収録刊行物
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- Journal of electron microscopy
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Journal of electron microscopy 55 (3), 129-135, 2006-06-01
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詳細情報 詳細情報について
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- CRID
- 1570291225416276608
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- NII論文ID
- 10018790986
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- NII書誌ID
- AA00697060
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- ISSN
- 00220744
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- 本文言語コード
- en
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- データソース種別
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- CiNii Articles