Wrapper Design for the Reuse of Networks-on-Chip as Test Access Mechanism

Journal

European Test Symposium, 2006  

European Test Symposium, 2006, 2006 

Cited by:  1

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Codes

  • NII Article ID (NAID) :
    10018853092
  • Article Type :
    Proceedings
  • Databases :
    CJPref 

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