Photon irradiation effects on Si multiple-tunnel-junction field-effect transistors : Sensing the presence of a single-charge in the substrate

• BURHANUDIN Zainal

  Research Institue of Electronics, Shizuoka University

• NURYADI Ratno

  Research Institue of Electronics, Shizuoka University

• TABE Michiharu

  Research Institue of Electronics, Shizuoka University

Journal

• 電子情報通信学会技術研究報告. ITS

  電子情報通信学会技術研究報告. ITS 106 (535), 89-94, 2007-02-16

Keywords

• Single-hole-tunneling transistor
• single-photon detector
• single-acceptor ion

Details

• CRID: 1573950400104856576
• NII Article ID: 10018855227
• NII Book ID: AA11370324
• Text Lang: en
• Data Source:
  • CiNii Articles