Charge-State and Isotope Effects on the Recovery Process of Stress-Induced Reorientation of Pt-H2 Complex in Silicon
Bibliographic Information
- Other Title
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- Charge State and Isotope Effects on the Recovery Process of Stress Induced Reorientation of Pt H2 Complex in Silicon
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Abstract
コレクション : 国立国会図書館デジタルコレクション > デジタル化資料 > 雑誌
Journal
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- Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP
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Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP 46 (3A), 907-912, 2007-03
Tokyo : Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physics
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Keywords
Details 詳細情報について
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- CRID
- 1520572358040940800
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- NII Article ID
- 10018866557
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- NII Book ID
- AA10457675
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- ISSN
- 00214922
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- NDL BIB ID
- 8687866
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- Text Lang
- en
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- NDL Source Classification
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- ZM35(科学技術--物理学)
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- Data Source
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- NDL
- CiNii Articles