Optical Properties of Vanadium Dioxide Film during Semiconductive–Metallic Phase Transition

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著者

    • Kakiuchida Hiroshi Kakiuchida Hiroshi
    • Materials Research Institute for Sustainable Development, National Institute of Advanced Industrial Science and Technology (AIST), 2266-98 Anagahora, Shimoshidami, Moriyama, Nagoya 463-8560, Japan
    • Jin Ping Jin Ping
    • Materials Research Institute for Sustainable Development, National Institute of Advanced Industrial Science and Technology (AIST), 2266-98 Anagahora, Shimoshidami, Moriyama, Nagoya 463-8560, Japan
    • Nakao Setsuo [他] Nakao Setsuo
    • Materials Research Institute for Sustainable Development, National Institute of Advanced Industrial Science and Technology (AIST), 2266-98 Anagahora, Shimoshidami, Moriyama, Nagoya 463-8560, Japan
    • Tazawa Masato
    • Materials Research Institute for Sustainable Development, National Institute of Advanced Industrial Science and Technology (AIST), 2266-98 Anagahora, Shimoshidami, Moriyama, Nagoya 463-8560, Japan

抄録

The optical constants of vanadium dioxide (VO2) films were determined at visible and near-infrared wavelengths at various temperatures during a semiconductive–metallic phase transition by ellipsometric analysis with Lorentz-oscillator formulae. The reversible changes in optical constants against temperature due to thermochromism were observed at around 70 °C. The wavelength dispersions of the optical constants were well expressed by the sum of three oscillators and their oscillating energies were attributed to photon-excited transitions. The variation in band structure during the phase transition was monitored, and the relationship between the band structure and optical properties was discussed.

収録刊行物

  • Japanese journal of applied physics. Pt. 2, Letters

    Japanese journal of applied physics. Pt. 2, Letters 46(5), L113-L116, 2007-02-25

    Japan Society of Applied Physics

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各種コード

  • NII論文ID(NAID)
    10018867961
  • NII書誌ID(NCID)
    AA10650595
  • 本文言語コード
    EN
  • 資料種別
    SHO
  • ISSN
    0021-4922
  • NDL 記事登録ID
    8661958
  • NDL 雑誌分類
    ZM35(科学技術--物理学)
  • NDL 請求記号
    Z54-J337
  • データ提供元
    CJP書誌  NDL  JSAP 
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