Fully-Digital Time-to-Digital Converter for ATE with Autonomous Calibration

• RIVOIR J.

収録刊行物

• IEEE International Test Conference, Santa Clara, (Oct. 2006)

  IEEE International Test Conference, Santa Clara, (Oct. 2006) 2006

詳細情報

• CRID: 1572261550244095488
• NII論文ID: 10018898445
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  • CiNii Articles