Electric Field Relaxation around ε-FGM Insulators and Improvement of Surface Breakdown Characteristics

Bibliographic Information

Other Title
  • 誘電率傾斜誘電体の電界緩和効果と気中沿面絶縁耐力向上

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Details 詳細情報について

  • CRID
    1571417125369355008
  • NII Article ID
    10018986752
  • NII Book ID
    AN10320559
  • Text Lang
    ja
  • Data Source
    • CiNii Articles

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