SrS:Ce薄膜EL素子のアルカリ金属添加によるSr欠陥の補償効果  [in Japanese] Suppression of Formation of Sr Vacancies in SrS:Ce Thin Film EL Devices by Alkali Metal Doping  [in Japanese]

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Author(s)

Journal

  • 電気学会研究会資料. EDD, 電子デバイス研究会  

    電気学会研究会資料. EDD, 電子デバイス研究会 2003(1), 33-36, 2003-01-27 

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Codes

  • NII Article ID (NAID)
    10018990238
  • NII NACSIS-CAT ID (NCID)
    AN1044178X
  • Text Lang
    JPN
  • Article Type
    ART
  • Data Source
    CJP 
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