The 5^<th> Generation Highly Rugged Planar IGBT Using Sub-micron Process Technology

• YAMASHITA Junichi

  Mitsubishi Electric Corporation

• TAKANASHI Ken

  Mitsubishi Electric Corporation

• MORITANI Junichi

  Mitsubishi Electric Corporation

• HINE Shiro

  Mitsubishi Electric Corporation

Bibliographic Information

Other Title

• 高破壊耐量5世代平面IGBT

Journal

• 電気学会研究会資料. EDD, 電子デバイス研究会

  電気学会研究会資料. EDD, 電子デバイス研究会 2001 (76), 53-56, 2001-10-26

Keywords

• IGBT
• ruggedness
• emitter ballast resistance
• inverter

Details

• CRID: 1570009750458805632
• NII Article ID: 10018991699
• NII Book ID: AN1044178X
• Text Lang: ja
• Data Source:
  • CiNii Articles