画像処理による電子部品検査の実利用  [in Japanese] Practical Use of Inspection for Molded Electronic Devices by Image Processing  [in Japanese]

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Author(s)

Journal

  • 電気学会研究会資料. IP, 情報処理研究会  

    電気学会研究会資料. IP, 情報処理研究会 2001(1), 23-28, 2001-11-22 

References:  7

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Codes

  • NII Article ID (NAID)
    10018992925
  • NII NACSIS-CAT ID (NCID)
    AN10442589
  • Text Lang
    JPN
  • Article Type
    ART
  • Data Source
    CJP 
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