A New Model to Simulate Critical Current Degradation of a Large CICC by Taking Into Account Strand Bending

• KOIZUMI N.

収録刊行物

• IEEE Trans. Appl. Supercond.

  IEEE Trans. Appl. Supercond. 16 (2), 831-834, 2006

詳細情報

• CRID: 1571980075500643072
• NII論文ID: 10021130912
• データソース種別:
  • CiNii Articles