温度ゆらぎによる配電盤母線接続部劣化診断手法の開発 [in Japanese] Development of Deterioration Diagnosis Technique for Bus Joint in Switchboards with Temperature Fluctuation [in Japanese]
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We developed deterioration diagnosis technique for bus Joint in Switchboards. Increase of contact resistance by deterioration of a bus joint causes a temperature rise. However, it is difficult to really measure a temperature rise by a minute change of contact resistance. That is a method to detect a change of contact resistance of a bus joint as a temperature fluctuation. We expect that a serious accident such as a short circuit is prevented beforehand by this technique.
- IEEJ Transactions on Sensors and Micromachines
IEEJ Transactions on Sensors and Micromachines 128(5), 584-587, 2008-05-01
The Institute of Electrical Engineers of Japan