Characteristic of a Plastic Film Thickness Measuring System Using a Slit Beam X-ray
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- Tojo Fumio
- Interdisci. Grad. School of Sci. and Engi., Grad. School of Kinki Univ. Yamabun electronics. Co., Ltd.
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- Hirakawa Shunzo
- Yamabun electronics. Co., Ltd.
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- Toyoda Toshiyasu
- Yamabun electronics. Co., Ltd.
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- Iguchi Masaru
- Yamabun electronics. Co., Ltd.
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- Katayama Yusuke
- Yamabun electronics. Co., Ltd.
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- Itoh Mineo
- Interdisci. Grad. School of Sci. and Engi., Grad. School of Kinki Univ.
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Abstract
The employment of plastic films has increased rapidly with use in flat-panel displays, secondary cells, and electronic devices, in order to make such devices lighter, thinner, and denser. Conventionally, the X-ray thickness measuring system for plastic films usually employs an X-ray spot beam of 10-20mm in diameter. However, this beam area is too large to measure some films, such as small size film components used in electronic devices. Therefore, it is necessary to improve the resolution ability. In the present study for solving this problem, the authors describe a new measuring system using a slit beam X-ray of 0.4mm to accurately measure the thickness of plastic films. The use of this system can drastically improve the resolution in the measurement of plastic film thickness, resulting in an accuracy of ±2.7% or less, for the sample film by the superposition of a polypropylene tape (PP, thickness: 30μm, width: 1or 20mm) over a PP film (thickness: 30μm).
Journal
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- IEEJ Transactions on Industry Applications
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IEEJ Transactions on Industry Applications 128 (5), 601-606, 2008
The Institute of Electrical Engineers of Japan
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Details 詳細情報について
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- CRID
- 1390282679636123264
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- NII Article ID
- 10021134256
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- NII Book ID
- AN10012320
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- ISSN
- 13488163
- 09136339
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- NDL BIB ID
- 9495942
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- Text Lang
- en
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed