培養環境の違いによる酵母の非線形誘電応答 Nonlinear Dielectric Properties of Yeast Cells Cultured in Different Environmental Conditions

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著者

    • 河西 吾門 KAWANISHI Gomon
    • 大阪市立大学大学院工学研究科電子情報系専攻 Department of Physical Electronics & Information, Graduate School of Engineering, Osaka City University
    • 福田 直記 FUKUDA Naoki
    • 大阪市立大学大学院工学研究科電子情報系専攻 Department of Physical Electronics & Information, Graduate School of Engineering, Osaka City University
    • 村治 雅文 MURAJI Masafumi
    • 大阪市立大学大学院工学研究科電子情報系専攻 Department of Physical Electronics & Information, Graduate School of Engineering, Osaka City University

抄録

The harmonics of the electric current through yeast suspensions, the nonlinear dielectric properties of yeast cells, have particular patterns according to the biological activity of the cells and the measurement of these patterns is a technique for determining the activity of living cells. The concentration of glucose and oxygen in yeast culture medium influences the manifestation of fermentation or respiration of yeast cells. Measurements were made with yeast cells (<i>Saccharomyces cerevisiae</i>) cultured aerobically and anaerobically in sufficient glucose concentration, aerobic fermentation and anaerobic fermentation, and aerobically in limited glucose concentration, respiration. The results showed that the harmonics were barely apparent for yeast cells in aerobic fermentation and respiratory; however, cells in the anaerobic fermentation displayed substantial third and fifth harmonics. We can say that environmental condition affects the yeast cells' nonlinear properties, from another viewpoint, the measurements of the nonlinear properties are available to determine the activity of yeast cells adjusted to the conditions of their cultivation.

収録刊行物

  • 電気学会論文誌. E, センサ・マイクロマシン準部門誌 = The transactions of the Institute of Electrical Engineers of Japan. A publication of Sensors and Micromachines Society  

    電気学会論文誌. E, センサ・マイクロマシン準部門誌 = The transactions of the Institute of Electrical Engineers of Japan. A publication of Sensors and Micromachines Society 128(2), 47-52, 2008-02-01 

    The Institute of Electrical Engineers of Japan

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各種コード

  • NII論文ID(NAID)
    10021134946
  • NII書誌ID(NCID)
    AN1052634X
  • 本文言語コード
    JPN
  • 資料種別
    ART
  • ISSN
    13418939
  • NDL 記事登録ID
    9361389
  • NDL 雑誌分類
    ZN31(科学技術--電気工学・電気機械工業)
  • NDL 請求記号
    Z16-B380
  • データ提供元
    CJP書誌  NDL  J-STAGE 
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