Oblique Angle Deposition of Columnar Niobium Films for Capacitor Application

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Niobium films with isolated columnar morphology have been prepared by oblique angle magnetron sputtering for capacitor application. Anodizing of the deposited niobium to form dielectric niobium oxide reduces the surface roughness, since the gaps between the neighboring columns are filled with the oxide due to large Pilling-Bedworth ratio for Nb/Nb<SUB>2</SUB>O<SUB>5</SUB>. To increase the gaps between neighboring columns, the influences of the angle of niobium flux to substrate and substrate surface roughness on the columnar morphology of the deposited films have been investigated using scanning electron microscopy and the electrochemical measurements. The deposition on the textured rough substrate surface and at higher angle of the niobium flux from normal to the substrate surface fabricates the niobium films with higher surface roughness.

収録刊行物

  • Materials transactions  

    Materials transactions 49(6), 1320-1326, 2008-06-01 

    The Japan Institute of Metals and Materials

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各種コード

  • NII論文ID(NAID)
    10021147497
  • NII書誌ID(NCID)
    AA1151294X
  • 本文言語コード
    ENG
  • 資料種別
    ART
  • ISSN
    13459678
  • NDL 記事登録ID
    9519203
  • NDL 雑誌分類
    ZP41(科学技術--金属工学・鉱山工学)
  • NDL 請求記号
    Z53-J286
  • データ提供元
    CJP書誌  NDL  J-STAGE 
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