Fe_<2.4>Sm合金薄膜の磁場誘起運動に及ぼすAl基板厚さ依存性 Thickness Dependence of Aluminum Substrate on Magnetic Field Induced Bending Motion of Compressive Magnetostrictive Fe_<2.4>Sm Alloy Film

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著者

    • 中野 良 NAKANO Ryo
    • 東海大学大学院工学研究科 Department of Metallurgical Engineering, Graduate School of Engineering, Tokai University
    • 西 義武 NISHI Yoshitake
    • 東海大学大学院工学研究科 Department of Metallurgical Engineering, Graduate School of Engineering, Tokai University

抄録

  Thickness dependence of aluminum substrate on magnetic field induced bending motion of Fe<sub>2.4</sub>Sm alloy thin film prepared by direct current magnetron sputtering process was investigated. The residual gas pressure before argon sputtering and the sputtering pressure of argon gas (5 N) were less than 3.3×10<sup>-4</sup> Pa and 2.0×10<sup>-1</sup> Pa, respectively. The thickness of the Fe<sub>2.4</sub>Sm films deposited was about 2.1 μm. Bending motion of Fe<sub>2.4</sub>Sm alloy film largely depended on substrate thickness. The large bending motion induced by magnetic field and its high susceptibility were found in the compressive magnetostrictive Fe<sub>2.4</sub>Sm alloy film on aluminum thin sheet.<br>

収録刊行物

  • 日本金屬學會誌 = Journal of the Japan Institute of Metals  

    日本金屬學會誌 = Journal of the Japan Institute of Metals 72(5), 371-375, 2008-05-01 

    The Japan Institute of Metals

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各種コード

  • NII論文ID(NAID)
    10021150359
  • NII書誌ID(NCID)
    AN00062446
  • 本文言語コード
    JPN
  • 資料種別
    ART
  • ISSN
    00214876
  • NDL 記事登録ID
    9514437
  • NDL 雑誌分類
    ZP41(科学技術--金属工学・鉱山工学)
  • NDL 請求記号
    Z17-314
  • データ提供元
    CJP書誌  NDL  J-STAGE 
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