FIB法によるDAC試料のTEM薄膜試料作製 Preparation of TEM Foil from DAC Sample using Focused Ion Beam System
Analytical transmission electron microscope (ATEM) is a powerful tool for analyses of the samples recovered from ultrahigh pressure experiments. Recently, Focused Ion Beam (FIB) system has been applied to prepare a TEM foil of sample recovered from laser heated diamond anvil cell (LHDAC). It has some advantages compared to conventional argon ion milling method. In this article, recent advances in the DAC sample preparation for TEM observation using FIB system are reviewed.
- 高圧力の科学と技術 = The Review of high pressure science and technology
高圧力の科学と技術 = The Review of high pressure science and technology 18(1), 38-43, 2008-02-20
The Japan Society of High Pressure Science and Technology