New Simple Photoemission Electron Microscope with an Energy Filter

• TÓTH László

  Nara Institute of Science and Technology (NAIST) Japan Science and Technology Agency

• MATSUDA Hiroyuki

  Nara Institute of Science and Technology (NAIST) Japan Science and Technology Agency

• SHIMIZU Tatsuya

  Nara Institute of Science and Technology (NAIST)

• MATSUI Fumihiko

  Nara Institute of Science and Technology (NAIST) Japan Science and Technology Agency

• DAIMON Hiroshi

  Nara Institute of Science and Technology (NAIST) Japan Science and Technology Agency

Abstract

  We have developed a new Wide Acceptance Angle Electrostatic Lens (WAAEL) and applied that as display-type electron energy analyser. Our present lens achieves ±60° (1π sr) acceptance angle and has a good focusing capability with 5-times magnifications. The relative energy resolution is typically from 2 to 5×10^-3 and depends on the emission area on the sample, as well as, on the diameter of exit aperture. Some preliminary results and discussions related to its energy resolution are shown.<br>

Journal

• Journal of the Vacuum Society of Japan

  Journal of the Vacuum Society of Japan 51 (3), 135-137, 2008

  The Vacuum Society of Japan

Keywords

• Spectroscopy
• Surfaces and Interfaces
• Instrumentation
• General Materials Science

Details

• CRID: 1390282680272157568
• NII Article ID: 10021156890
• NII Book ID: AA12298652
• DOI: 10.3131/jvsj2.51.135
• ISSN: 18824749
• ISSN: 18822398
• NDL BIB ID: 9471368
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I9471368
• Text Lang: en
• Data Source:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• Abstract License Flag: Disallowed