バルク敏感角度分解光電子分光による固体3次元電子構造とフェルミ面の観測 Three-dimensional Fermiology Probed by Bulk-sensitive Angle-resolved Photoemission

この論文にアクセスする

この論文をさがす

著者

    • 関山 明 SEKIYAMA Akira
    • 大阪大学大学院基礎工学研究科物性物理工学領域 Division of Materials Physics, Graduate School of Engineering Science, Osaka University
    • 矢野 正雄 YANO Masao
    • 大阪大学大学院基礎工学研究科物性物理工学領域 Division of Materials Physics, Graduate School of Engineering Science, Osaka University
    • 菅 滋正 SUGA Shigemasa
    • 大阪大学大学院基礎工学研究科物性物理工学領域 Division of Materials Physics, Graduate School of Engineering Science, Osaka University

抄録

  High-resolution and high-excitation energy photoemission spectroscopy has an advantage in probing the bulk electronic states in solids whereas the surface electronic states deviated from the bulk states are strongly reflected in low-excitation energy photoemission spectra which have so far extensively measured for many materials. We have succeeded in realization of the high-energy bulk-sensitive angle-resolved photoemission in order to probe the three-dimensional electronic structures and the Fermi surfaces. After introducing the angle-integrated photoemission spectra of 3d<sup>1</sup>-electron system Sr<sub>1-x</sub>Ca<sub>x</sub>VO<sub>3</sub> as an example for the bulk (surface) sensitivity of the high-(low-)energy photoemission, we show the recently obtained results of high-energy angle-resolved photoemission for strongly correlated electron systems such as Sr<sub>2</sub>RuO<sub>4</sub> and ferromagnet CeRu<sub>2</sub>Ge<sub>2</sub> in the paramagnetic phase, revealing their bulk Fermi surfaces. It is found that the Fermi surfaces of CeRu<sub>2</sub>Ge<sub>2</sub> in the paramagnetic phase are substantially deviated from those in the ferromagnetic phase. Although our results for CeRu<sub>2</sub>Ge<sub>2</sub> are roughly explained by the band-structure calculation for LaRu<sub>2</sub>Ge<sub>2</sub>, a few qualitative discrepancies are seen.<br>

収録刊行物

  • 真空  

    真空 51(6), 357-363, 2008-06-20 

    The Vacuum Society of Japan

参考文献:  23件

参考文献を見るにはログインが必要です。ユーザIDをお持ちでない方は新規登録してください。

各種コード

  • NII論文ID(NAID)
    10021157579
  • NII書誌ID(NCID)
    AN00119871
  • 本文言語コード
    JPN
  • 資料種別
    REV
  • ISSN
    18822398
  • NDL 記事登録ID
    9571114
  • NDL 雑誌分類
    ZN15(科学技術--機械工学・工業--流体機械)
  • NDL 請求記号
    Z16-474
  • データ提供元
    CJP書誌  NDL  J-STAGE 
ページトップへ