Electric Field Analysis of the Simultaneous Evaluation of Location, Size, and Shape of a Semi-Elliptical Crack on the Back Surface and Plate Thickness Using Direct-Current Potential Difference Method of Multiple-Probe Type

• TADA Naoya

  Graduate School of Natural Science and Technology, Okayama University

• FUNAKOSHI Akira

  Kobe Shipyard & Machinery Works, Mitsubishi Heavy Industries, Ltd.

• UCHIDA Makoto

  Graduate School of Natural Science and Technology, Okayama University

• ISHIKAWA Hiroki

  Graduate School of Natural Science and Technology, Okayama University

Bibliographic Information

Other Title

• 多端子型直流電位差法を用いた半楕円背面き裂の位置，寸法，形状と板厚の同時推定に関する電位場解析
• タタンシガタ チョクリュウ デンイサホウ オ モチイタ ハンダエン ハイメン キレツ ノ イチ スンポウ ケイジョウ ト イタアツ ノ ドウジ スイテイ ニ カンスル デンイバ カイセキ

Abstract

A method was proposed of simultaneous identification of a semi-elliptical crack on the back surface and the plate thickness using the direct-current potential difference method of multiple-probe type. The geometry of the crack was designated by six parameters : the two-dimensional location of the crack center on the back surface, the length, the depth, and the surface and inward angles of the crack. In addition to these six geometrical parameters, the plate thickness was evaluated. The evaluation was carried out based on the distribution of electric potential differences between two adjacent probes in the current direction within a square area on the front surface. In this study, the distribution of potential difference was obtained by the finite element method for twenty-seven different crack geometries. The results showed that the proposed method successfully evaluates the geometry of the crack on the back surface and the plate thickness. The method will be applicable to the non-destructive evaluation of a crack initiated on the inner surface of pipes with wall thinning which is often the case in various aged plants.

Journal

• Journal of The Japanese Society for Non-Destructive Inspection

  Journal of The Japanese Society for Non-Destructive Inspection 57 (3), 137-141, 2008

  The Japanese Society for Non-Destructive Inspection

Keywords

• Semi-elliptical crack
• Back surface
• Direct-current potential difference method
• Plate thickness
• Wall thinning
• Multiple-probe type

Details

• CRID: 1390001206493405312
• NII Article ID: 130004458091
• NII Article ID: 10021165020
• NII Book ID: AN00208370
• DOI: 10.11396/jjsndi.57.137
• NDL BIB ID: 9404081
• ISSN: 03675866
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I9404081
• Text Lang: ja
• Data Source:
  • JaLC
  • NDL
  • CiNii Articles
• Abstract License Flag: Disallowed