走査型プローブ顕微鏡にみる電圧印加のナノ力学的相互作用 Nanomechanical Interaction between a Tip and a Sample with Changing Bias Voltage Observed by Using Scanning Probe Microscopy

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著者

    • 富取 正彦 TOMITORI Masahiko
    • 北陸先端科学技術大学院大学 マテリアルサイエンス研究科 School of Materials Science, Japan Advanced Institute of Science and Technology

抄録

A novel surface spectroscopic method referred to itself as noncontact atomic force spectroscopy (nc-AFS) is presented, which is based on noncontact atomic force microscopy (nc-AFM) and scanning tunneling spectroscopy (STS) of the family of scanning probe microscopy (SPM). The interaction force and current are measured with sweeping bias voltage between a tip and a sample at a close tip-sample separation, and analyzed in terms of surface spectroscopy. The spectra obtained by the nc-AFS indicate that the resonance states, i. e., covalent bonding, between a Si tip and a Si sample can be formed by tuning the bias voltage, corresponding to the relative shift of energy levels of tip states and sample states. Moreover, the nc-AFS combined with current measurement exhibits potential of evaluating the collapse of tunneling barrier and analyzing the correlation between force interaction and electron conductance between two pieces of condensed matter in proximity.

収録刊行物

  • 表面科学 = Journal of The Surface Science Society of Japan  

    表面科学 = Journal of The Surface Science Society of Japan 29(4), 239-245, 2008-04-10 

    日本表面科学会

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各種コード

  • NII論文ID(NAID)
    10021165886
  • NII書誌ID(NCID)
    AN00334149
  • 本文言語コード
    JPN
  • 資料種別
    REV
  • ISSN
    03885321
  • NDL 記事登録ID
    9469488
  • NDL 雑誌分類
    ZM35(科学技術--物理学)
  • NDL 請求記号
    Z15-379
  • データ提供元
    CJP書誌  NDL  IR 
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