Ｘ線分光の現在　　Ｖ．共鳴Ｘ線散乱

• 村上 洋一

  東北大学大学院理学研究科物理学専攻

書誌事項

タイトル別名

• Modern X-ray Spectroscopy V. Resonant X-ray Scattering
• Xセン ブンコウ ノ ゲンザイ 5 キョウメイ Xセン サンラン
• V. Resonant X-ray Scattering
• V.共鳴X線散乱

抄録

Resonant x-ray scattering (RXS) is a very powerful technique to detect the charge distribution and magnetization density with a synchrotron radiation source. Recently this technique has been applied to study charge-, spin-, and orbital-orderings in strongly correlated electron systems. In this paper the cross section and the scattering amplitude of RXS are given on the basis of the interaction between electrons in matter and electromagnetic wave.The atomic scattering factor becomes a tensor instead of a scalar through the resonant process. Charge and orbital orderings of perovskite manganites have been studied using the RXS technique. It is shown that the RXS intensities have characteristics in energy, polarization, and azimuthal angle dependences. Finally an outlook for the RXS technique is briefly mentioned.

収録刊行物

• 分光研究

  分光研究 57 (5), 254-263, 2008

  社団法人 日本分光学会

キーワード

• resonant x-ray sacattering
• charge ordering
• orbital ordering

詳細情報

• CRID: 1390001206258714496
• NII論文ID: 10021874530
• NII書誌ID: AN00222531
• DOI: 10.5111/bunkou.57.254
• ISSN: 18846785
• ISSN: 00387002
• NDL書誌ID: 9693316
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I9693316
• 本文言語コード: ja
• データソース種別:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• 抄録ライセンスフラグ: 使用不可