Nanometer Scale Length Standard Using Regular Crystalline Lattice

• AKETAGAWA Masato

  Department of Mechanical Engineering, Nagaoka University of Technology

Bibliographic Information

Other Title

• 結晶格子を利用したナノスケール標準の確立
• ケッショウ コウシ オ リヨウシタ ナノスケール ヒョウジュン ノ カクリツ

Journal

• Journal of The Society of Instrument and Control Engineers

  Journal of The Society of Instrument and Control Engineers 47 (9), 763-768, 2008-09-10

  The Society of Instrument and Control Engineers

Keywords

• regular crystalline lattice
• nanometer
• picometer
• x-ray interferometry
• scanning tunneling microscope
• optical laser interferometry
• meter standard

Details

• CRID: 1390294186597739520
• NII Article ID: 10021991290
• NII Book ID: AN00072406
• DOI: 10.11499/sicejl.47.763
• ISSN: 18838170
• ISSN: 04534662
• NDL BIB ID: 9651019
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I9651019
• Text Lang: ja
• Data Source:
  • JaLC
  • NDL
  • CiNii Articles