Evaluation of Surface Properties of Polymeric Materials by Atomic Force Microscopy

• Nakajima Ken

  WPI Advanced Institute for Materials Research, Tohoku University

• Fujinami So

  WPI Advanced Institute for Materials Research, Tohoku University

• Nishi Toshio

  WPI Advanced Institute for Materials Research, Tohoku University

Bibliographic Information

Other Title

• 原子間力顕微鏡による高分子材料表面の物性評価
• ゲンシカンリョク ケンビキョウ ニ ヨル コウブンシ ザイリョウ ヒョウメン ノ ブッセイ ヒョウカ

Abstract

Nano-palpation technique based on atomic force microscopy is explained. The technique can be used to evaluate several materials' properties. The background theories of the technique is explained and the comparison with nano-indenter system was made to clarify the advantage of the technique. Hertzian contact theory and JKR theory are introduced for elastic contacts without and with adhesive interaction, respectively. The practical example studies such as rubber blend or paint material are also explained.

Journal

• Journal of the Japan Society of Colour Material

  Journal of the Japan Society of Colour Material 81 (9), 354-360, 2008

  Japan Society of Colour Material

Keywords

• Nano-palpation
• Atomic force microscopy
• Material property
• Hertzian contact
• JKR contact

Details

• CRID: 1390282679117459712
• NII Article ID: 10021998959
• NII Book ID: AN00354634
• DOI: 10.4011/shikizai.81.354
• COI: 1:CAS:528:DC%2BD1cXht12jsbzO
• ISSN: 18832199
• ISSN: 0010180X
• NDL BIB ID: 9654302
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I9654302
• Data Source:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
  • KAKEN
• Abstract License Flag: Disallowed