蛍光X線分光法による電子部品中のレアメタルおよび貴金属の分析 [in Japanese] Analysis of Rare and Noble Metals in Electric Devices by X-Ray Fluorescence Spectroscopy [in Japanese]
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Rare and noble metals contained in electric and electronic devices were analyzed by a commercially available energy dispersive X-ray fluorescence spectrometer. Several kinds of rare and noble metals such as nickel, cobalt, tungsten, zirconium, gold, silver, and bismuths were detected by analysis of the samples at inside part after removal of the package or crushing. Both bromine and antimony were detected in the most electronic part which contains plastics. The classification of elements contained and the procedures for identification of emission peaks in X-ray fluorescence spectrum were explained.
Shigen-to-Sozai 124(9), 594-598, 2008-09-25
The Mining and Materials Processing Institute of Japan