蛍光X線分光法による電子部品中のレアメタルおよび貴金属の分析 Analysis of Rare and Noble Metals in Electric Devices by X-Ray Fluorescence Spectroscopy

この論文にアクセスする

この論文をさがす

著者

抄録

Rare and noble metals contained in electric and electronic devices were analyzed by a commercially available energy dispersive X-ray fluorescence spectrometer. Several kinds of rare and noble metals such as nickel, cobalt, tungsten, zirconium, gold, silver, and bismuths were detected by analysis of the samples at inside part after removal of the package or crushing. Both bromine and antimony were detected in the most electronic part which contains plastics. The classification of elements contained and the procedures for identification of emission peaks in X-ray fluorescence spectrum were explained.

収録刊行物

  • Journal of MMIJ : journal of the Mining and Materials Processing Institute of Japan  

    Journal of MMIJ : journal of the Mining and Materials Processing Institute of Japan 124(9), 594-598, 2008-09-25 

    The Mining and Materials Processing Institute of Japan

参考文献:  16件

参考文献を見るにはログインが必要です。ユーザIDをお持ちでない方は新規登録してください。

各種コード

  • NII論文ID(NAID)
    10021999162
  • NII書誌ID(NCID)
    AA12188381
  • 本文言語コード
    JPN
  • 資料種別
    NOT
  • ISSN
    18816118
  • NDL 記事登録ID
    9664994
  • NDL 雑誌分類
    ZP41(科学技術--金属工学・鉱山工学)
  • NDL 請求記号
    Z17-315
  • データ提供元
    CJP書誌  NDL  J-STAGE 
ページトップへ