An Efficient Process-Evaluation Method for Ultra-Thin Gate Oxides
-
- LIU Chuan H.
- United Microelectronics Corp.
-
- CHENG Tun-Jen
- United Microelectronics Corp.
-
- FU K. Y.
- United Microelectronics Corp.
この論文をさがす
収録刊行物
-
- Extended abstracts of the ... Conference on Solid State Devices and Materials
-
Extended abstracts of the ... Conference on Solid State Devices and Materials 1999 336-337, 1999-09-20
- Tweet
詳細情報 詳細情報について
-
- CRID
- 1570572700658322432
-
- NII論文ID
- 10022536843
-
- NII書誌ID
- AA10777858
-
- 本文言語コード
- en
-
- データソース種別
-
- CiNii Articles