Large Threshold Voltage Shift and Narrow Threshold Voltage Distribution in Ultra Thin Body Silicon Nanocrystal Memories

• YANAGIDAIRA Kosuke

  Institute of Industrial Science, University of Tokyo

• SAITOH Masumi

  Institute of Industrial Science, University of Tokyo

• HIRAMOTO Toshiro

  Institute of Industrial Science, University of Tokyo

収録刊行物

• Extended abstracts of the ... Conference on Solid State Devices and Materials

  Extended abstracts of the ... Conference on Solid State Devices and Materials 2004 130-131, 2004-09-15

詳細情報

• CRID: 1572261550519031680
• NII論文ID: 10022537984
• NII書誌ID: AA10777858
• 本文言語コード: en
• データソース種別:
  • CiNii Articles