Direct Silicon Bonded (DSB) Mixed Orientation Substrate for High Performance Bulk CMOS Technology
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- SUNG C. Y.
- Research Division, T.J. Watson Research Center
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- YIN Haizhou
- Semiconductor Research & Development Center Microelectronic Division
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- NG H.
- Semiconductor Research & Development Center Microelectronic Division
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- SAENGER K. L.
- Research Division, T.J. Watson Research Center
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- PFEIFFER G.
- Semiconductor Research & Development Center Microelectronic Division
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- CHAN V.
- Semiconductor Research & Development Center Microelectronic Division
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- ZHANG R.
- Semiconductor Research & Development Center Microelectronic Division
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- LI J.
- Semiconductor Research & Development Center Microelectronic Division
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- OTT J. A.
- Research Division, T.J. Watson Research Center
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- BENDERNAGEL R.
- Semiconductor Research & Development Center Microelectronic Division
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- KO S. B.
- Semiconductor Research & Development Center Microelectronic Division
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- REN Z.
- Semiconductor Research & Development Center Microelectronic Division
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- CHEN X.
- Semiconductor Research & Development Center Microelectronic Division
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- KU V.
- Semiconductor Research & Development Center Microelectronic Division
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- LUO Z. J.
- Semiconductor Research & Development Center Microelectronic Division
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- ROVEDO N.
- Semiconductor Research & Development Center Microelectronic Division
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- FOGEL K.
- Research Division, T.J. Watson Research Center
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- KHARE M.
- Research Division, T.J. Watson Research Center
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- SHAHIDI G.
- Research Division, T.J. Watson Research Center
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- CROWDER S.
- Semiconductor Research & Development Center Microelectronic Division
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収録刊行物
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- Extended abstracts of the ... Conference on Solid State Devices and Materials
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Extended abstracts of the ... Conference on Solid State Devices and Materials 2006 160-161, 2006-09-13
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詳細情報 詳細情報について
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- CRID
- 1570291225695270528
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- NII論文ID
- 10022544664
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- NII書誌ID
- AA10777858
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- 本文言語コード
- en
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- データソース種別
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- CiNii Articles