Full Range Work Function Modulation by Nitrogen Incorporation in Hf-Mo Binary Alloys Gate Electrode

  • LAI Chao-Sung
    Department of Electronic Engineering, Chang Gung University
  • HUANG Chin-Wei
    Department of Electronic Engineering, Chang Gung University
  • PENG Hsing-Kan
    Department of Electronic Engineering, Chang Gung University
  • CHEN Chih-Hsin
    Department of Electronic Engineering, Chang Gung University
  • FANG Yu-Ching
    Chung-Shan Institute of Science & Technology Materials & Electro-Optics Research Division
  • HSU Li
    Chung-Shan Institute of Science & Technology Materials & Electro-Optics Research Division
  • WANG Hui-Chun
    Chung-Shan Institute of Science & Technology Materials & Electro-Optics Research Division
  • LEE Chung-Yuan
    Nanya Technology Corporation
  • LIN Shian-Jyh
    Nanya Technology Corporation

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詳細情報 詳細情報について

  • CRID
    1573105975461969280
  • NII論文ID
    10022549109
  • NII書誌ID
    AA10777858
  • 本文言語コード
    en
  • データソース種別
    • CiNii Articles

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