Test wrapper and test access mechanism co-optimization for system-on-chip

Journal

Journal of Electronic Testing : Theory and Applications  

Journal of Electronic Testing : Theory and Applications 18, 213-230, 2002 

Cited by:  1

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Codes

  • NII Article ID (NAID) :
    10024990081
  • Article Type :
    Journal Article
  • Databases :
    CJPref 

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