A Method for Compensating Multiple-Reflection Effect in Measurement of Electro-Optic Coefficient
-
- IWAMURA Tomo
- Faculty of Science and Technology, Keio University
-
- SUKA Shota
- Faculty of Science and Technology, Keio University
-
- LIU Xin Yi
- Faculty of Science and Technology, Keio University
-
- UMEGAKI Shinsuke
- Faculty of Science and Technology, Keio University
この論文をさがす
収録刊行物
-
- Optical review
-
Optical review 16 (1), 4-10, 2009-02-01
- Tweet
キーワード
詳細情報 詳細情報について
-
- CRID
- 1571417125821804800
-
- NII論文ID
- 10025303868
-
- NII書誌ID
- AA11029291
-
- ISSN
- 13406000
-
- 本文言語コード
- en
-
- データソース種別
-
- CiNii Articles