Statistical Analysis Related to Impulse Tests for Self-Restoring Insulation

• KOMORI Yoshio

  Department of Systems Design and Informatics, Kyushu Institute of Technology

収録刊行物

• IEEJ transactions on electrical and electronic engineering : official journal of the Institute of Electrical Engineering of Japan / = 電気学会

  IEEJ transactions on electrical and electronic engineering : official journal of the Institute of Electrical Engineering of Japan / = 電気学会 3 (6), 680-687, 2008-11-01

キーワード

• maximum likelihood estimation
• normal distribution
• dielectric breakdown
• impulse testing
• up-and-down test
• step-up test

詳細情報

• CRID: 1573105975733333120
• NII論文ID: 10025773695
• NII書誌ID: AA12144998
• ISSN: 19314973
• 本文言語コード: en
• データソース種別:
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