Development of an ultra-high resolution SPECT system with a CdTe semiconductor detector

  • OGAWA Koichi
    Department of Applied Informatics, Faculty of Science and Engineering, Hosei University
  • OHMURA Naoka
    Department of Applied Informatics, Faculty of Science and Engineering, Hosei University
  • IIDA Hirokazu
    Department of Applied Informatics, Faculty of Science and Engineering, Hosei University
  • NAKAMURA Kayoko
    Department of Radiology, Keio University School of Medicine
  • NAKAHARA Tadaki
    Department of Radiology, Keio University School of Medicine
  • KUBO Atsushi
    Department of Radiology, Keio University School of Medicine

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