書誌事項
- タイトル別名
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- Evaluation of the Alignment of Liquid Crystal Molecules on SiO2 Alignment Layer by Attenuated Total Reflection Method Utilizing Surface Plasmon and Guided Wave Excitation Modes
- 表面プラズモン・導波モード同時励起型全反射減衰法によるSi02配向膜上5CB液晶分子の配向評価
- ヒョウメン プラズモン ドウハ モード ドウジレイキガタ ゼン ハンシャ ゲンスイホウ ニ ヨル Si02ハイコウ マク ジョウ 5CB エキショウ ブンシ ノ ハイコウ ヒョウカ
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In this study, we report on the evaluation of tilt angles of liquid crystal (LC) molecules near the surface of SiO2 alignment layers and in the whole cell when constant voltages are applied. A LC molecule, 4-cyano-4'n-pentylbiphenyl, was used in this study. The LC cell consisted of Au (50nm) / SiO2 (30nm) /LC (3 μm)/ SiO2 (30nm) / Au (100nm) system. SiO2 alignment layers were obliquely evaporated on both Au surfaces. Surface plasmon resonance and guided waveguide excitation modes in attenuated total reflection configuration were used to monitor the alignment property of LC molecules adjacent to the surface and the bulk in the LC cell. In the ATR angular scan properties, the theoretical fittings agreed well with the experimental data on the assumption of simplified 5 LC layers model. The profile of the tilt angles from the surface to inside the cells was obtained by the theoretical fitting. In comparison with the internal bulk region, LC molecules near the surface required higher voltages to change their tilt angles toward vertical direction. As demonstrated in this report, this technique should provide the useful information to understand the interfacial phenomena for LC displays.
収録刊行物
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- 電気学会論文誌. A
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電気学会論文誌. A 130 (2), 193-197, 2010
一般社団法人 電気学会
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詳細情報 詳細情報について
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- CRID
- 1390282679574999040
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- NII論文ID
- 10026225281
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- NII書誌ID
- AN10136312
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- ISSN
- 13475533
- 03854205
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- NDL書誌ID
- 10568257
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
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