On Detection of Bridge Defects with Stuck-at Tests

DOI 機関リポジトリ HANDLE Web Site 参考文献21件
  • MIYASE Kohei
    Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology The Institute of Electronics, Information and Communication Engineers
  • TERASHIMA Kenta
    Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology
  • WEN Xiaoqing
    Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology The Institute of Electronics, Information and Communication Engineers
  • KAJIHARA Seiji
    Faculty of Computer Science and Systems Engineering, Kyushu Institute of Technology The Institute of Electronics, Information and Communication Engineers
  • REDDY Sudhakar M.
    Department of Electrical and Computer Engineering, University of Iowa

この論文をさがす

抄録

If a test set for more complex faults than stuck-at faults is generated, higher defect coverage would be obtained. Such a test set, however, would have a large number of test vectors, and hence the test costs would go up. In this paper we propose a method to detect bridge defects with a test set initially generated for stuck-at faults in a full scan sequential circuit. The proposed method doesn't add new test vectors to the test set but modifies test vectors. Therefore there are no negative impacts on test data volume and test application time. The initial fault coverage for stuck-at faults of the test set is guaranteed with modified test vectors. In this paper we focus on detecting as many as possible non-feedback AND-type, OR-type and 4-way bridging faults, respectively. Experimental results show that the proposed method increases the defect coverage.

収録刊行物

参考文献 (21)*注記

もっと見る

キーワード

詳細情報 詳細情報について

問題の指摘

ページトップへ