外部等角写像への代用電荷法の適用  [in Japanese] Application of the Charge Simulation Method to Conformal Mapping of Exterior Domains  [in Japanese]

Journal

Memoirs of the Faculty of Engineering, Ehime University   [List of Volumes]

Memoirs of the Faculty of Engineering, Ehime University 14, 553-562, 1995-02  [Table of Contents]

Ehime University

Codes

  • NII Article ID (NAID) :
    110000116809
  • NII NACSIS-CAT ID (NCID) :
    AN00024855
  • Text Lang :
    JPN
  • Journal Type :
    大学紀要
  • ISSN :
    02856107
  • NDL Article ID :
    3609023
  • NDL Source Classification :
    解析学
  • NDL Source Classification :
    ZM2(科学技術--科学技術一般--大学・研究所・学会紀要)
  • NDL Call No. :
    Z14-23
  • Databases :
    NDL  NII-ELS