透明薄膜の屈折率の新しい決定法およびそのMgO膜への適用  [in Japanese] Determination of the Refractive Index of Transparent Thin Films and its Application to a MgO Film  [in Japanese]

Journal

Technical reports of Seikei University   [List of Volumes]

Technical reports of Seikei University 33(1/2), 7-10, 1996-09-00  [Table of Contents]

Seikei University

Codes

  • NII Article ID (NAID) :
    110000553830
  • NII NACSIS-CAT ID (NCID) :
    AN10431017
  • Text Lang :
    JPN
  • ISSN :
    09199888
  • NDL Article ID :
    4035923
  • NDL Source Classification :
    ZM2(科学技術--科学技術一般--大学・研究所・学会紀要)
  • NDL Call No. :
    Z14-345
  • Databases :
    NDL  NII-ELS 

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