書誌事項
- タイトル別名
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- Factor Analysis on Ionic Migration Process of Lead-Free Solder Using QCM Method.
- QCMホウ ニ ヨル ナマリ フリー ハンダ ノ イオンマイグレーション カテイ ニ オヨボス ヨウイン カイセキ
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In recent years, problems have been arisen such as failure between conductors on printedcircuit board caused by ionic migration due to the high-density surface mounting of electric equipment and the popularization of portable equipment. Ionic migration occurs under the influence of an applied electric field, when water adheres to the site conductive patterns such as solder, copper, or silver. To investigate this phenomenon, new measurement method was developed by the authors, which enables in situ monitoring of migration process by quartz crystal microbalance (QCM) . As a result, the amount of anodic deposition and cathodic deposition, which influence migration growth, is smaller for lead-free solder than that for lead solder. The deposit on the cathode of lead solder was lead and that of lead-free solder was tin. Tin easily generates the oxide film compared with lead. Lead-free solder whose principal ingredient is tin formed the oxide film on anode electrode. And the anodic dissolution was controlled. Therefore, it is thought that the migration growth of lead-free solder is slower than that of lead solder. When the material which destroys the oxide film like flux exists, the migration growth is especially fast or even in the tin-zinc solder.
収録刊行物
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- エレクトロニクス実装学会誌
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エレクトロニクス実装学会誌 3 (7), 600-606, 2000
一般社団法人エレクトロニクス実装学会
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詳細情報 詳細情報について
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- CRID
- 1390001204561568384
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- NII論文ID
- 130004165815
- 110001238244
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- NII書誌ID
- AA11231565
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- ISSN
- 1884121X
- 13439677
- http://id.crossref.org/issn/13439677
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- NDL書誌ID
- 5537133
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
- Crossref
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- 抄録ライセンスフラグ
- 使用不可