13a-DK-8 高分解能電子顕微鏡による構造欠陥の研究  [in Japanese] 13a-DK-8 High-resolution electron microscopy of structural defects  [in Japanese]

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Author(s)

Journal

  • Abstracts of the meeting of the Physical Society of Japan. Sectional meeting   [List of Volumes]

    Abstracts of the meeting of the Physical Society of Japan. Sectional meeting 1993(2), 42-43, 1993-09-20  [Table of Contents]

    The Physical Society of Japan (JPS)

Codes

  • NII Article ID (NAID)
    110001995246
  • NII NACSIS-CAT ID (NCID)
    AN10453836
  • Text Lang
    JPN
  • Data Source
    NII-ELS 
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